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CISC Semiconductor is Exhibitor and Speaker at #WIOTtomorrow20

Benedikt Weigand, CISC Semiconductor will speak in the Automotive Forum on October 28th!

CISC Semiconductor, Austrian supplier of RFID and NFC test solutions, will be present again at the RFID & Wireless IoT tomorrow! In 2020, the international company will showcase its test systems at its booth in the exhibition and will also give a lecture at the Automotive Forum.

Event Info
09:00 - 17:00
27th & 28th October 2020
Darmstadt near Frankfurt Airport, Germany

Josef Preishuber-Pflügl, CTO and Business Manager RFID+NFC at CISC Semiconductor, appreciates the live participation at the RFID & Wireless IoT tomorrow:

"A digital version of the event is a good idea, but it cannot completely replace the live event. The LIVE aspect of the event allows authentic and trustful customer conversations with simultaneous hands-on experiences on the devices. The personal communication and consultation of our customers is much more intensive 'live' than on the phone. This important aspect cannot be digitally reproduced.”

RFID & NFC Test Solutions at Booth Number 34!

On October 27th and 28th, CISC Semiconductor will showcase its production and laboratory test solutions at its booth in the exhibition.

Products that belong to the field of 'production test solutions': NFC Xplorer Inline, RAIN Xplorer Inline and the Reel2Reel Tester. These three products guarantee the best quality assurance for mass production of RAIN RFID and NFC tags and labels. This allows label and reader manufacturers, as well as system integrators to verify the quality and functionality of the labels. The main focus of production is to check the RF interface and to detect problems in production processes.

As part of the laboratory test solutions, CISC Semiconductor offers the Xplorer product series of RAIN RFID and NFC test systems. The system covers all product development phases, from R&D to pre-conformance and performance testing. The RAIN RFID Xplorer and NFC Xplorer ensure optimal quality, reliability and interoperability of RAIN RFID and NFC hardware. The main focus in the laboratory: conformance tests, condition tests and automated software tests.

Josef Preishuber-Pflügl emphasizes: "Based on our existing test equipment, the next step is to expand the testing of RFID readers in R&D and also in production. With this step forward, we support the reader manufacturers in improving the product quality, especially with regard to RAIN RFID specific product features.”

CISC Semiconductor in the Automotive Forum

On October 28th, Benedikt Weigand will speak in the Automotive Forum on the topic, “Designing best suitable RFID tags to meet both minimum and maximum read range limits for automotive applications like load carriers and road tolling.”

Join the forum and learn more about RFID tag designs with optimal read ranges.

Over 60 Lectures in 8 Forums

Participant accreditation has already started! The Ticket Shop is now open!

More information about the conference program? Here!

Come and meet CISC Semiconductor at the RFID & Wireless IoT tomorrow 2020 on October 27th and 28th in Darmstadt, near Frankfurt Airport, Germany!


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