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CISC Semiconductor is Exhibitor and Speaker at #WIOTtomorrow20 DIGITAL

Benedikt Weigand, CISC Semiconductor will speak in the Automotive Forum on December 1st!

CISC Semiconductor, Austrian supplier of RFID and NFC test solutions, will be present again at the digital RFID & Wireless IoT tomorrow! In 2020, the international company will showcase its test systems at its digital booth in the exhibition and will also give a lecture at the Automotive Forum.

CISC Semiconductor is Exhibitor and Speaker at #WIOTtomorrow20 DIGITAL
Event Info
Live stream Conference from Nov 23rd to Dec 3rd
Virtual Exhibition from Nov 23rd to Dec 18th
https://www.rfid-wiot-tomorrow.com/

RFID & NFC Test Solutions at the Digital Booth!

CISC Semiconductor will showcase its production and laboratory test solutions at its booth in the digital exhibition.

Products that belong to the field of 'production test solutions': NFC Xplorer Inline, RAIN Xplorer Inline and the Reel2Reel Tester. These three products guarantee the best quality assurance for mass production of RAIN RFID and NFC tags and labels. This allows label and reader manufacturers, as well as system integrators to verify the quality and functionality of the labels. The main focus of production is to check the RF interface and to detect problems in production processes.

As part of the laboratory test solutions, CISC Semiconductor offers the Xplorer product series of RAIN RFID and NFC test systems. The system covers all product development phases, from R&D to pre-conformance and performance testing. The RAIN RFID Xplorer and NFC Xplorer ensure optimal quality, reliability and interoperability of RAIN RFID and NFC hardware. The main focus in the laboratory: conformance tests, condition tests and automated software tests.

Josef Preishuber-Pflügl emphasizes: "Based on our existing test equipment, the next step is to expand the testing of RFID readers in R&D and also in production. With this step forward, we support the reader manufacturers in improving the product quality, especially with regard to RAIN RFID specific product features.”

CISC Semiconductor in the Automotive Forum

On December 1st, Benedikt Weigand will speak in the Automotive Forum on the topic, “Designing best suitable RFID tags to meet both minimum and maximum read range limits for automotive applications like load carriers and road tolling.”

Join the forum and learn more about RFID tag designs with optimal read ranges.

Over 60 Lectures in 8 Forums

More information about the conference program? Here!

Come and meet CISC Semiconductor at the RFID & Wireless IoT tomorrow 2020 DIGITAL from November 23rd until December 18th!


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